INS-1250
500V - 30 kV impulse voltage generator
INS-1250 series generate a voltage impulse for insulation testing. The low energy impulses are ideal for testing without damage or destruction of the test object. This generator is ideal for isolation testing of semiconductor devices.
INS-1250 series generators deliver 1.2 / 50 us voltage impulses from 200 V to 30 kV in four compact units. Standard high voltage outputs on the top plate provide operator safety and simplify connection with test samples. Addition of the TC-ST test cabinet, warning lamp and emergency stop further enhance operator safety. Test programming on the colour touch panel is supported by an intuitive software structure and graphic help. With specialist accessories, INS-1250 generators are ideal for isolation testing of semiconductors. The integrated measurement circuits provide pass / fail evaluation with voltage and current integrals. Direct control of a DSO further enhances INS-1250 reporting capability. Test reports from the integrated web server can be viewed and manipulated in any internet browser.
Pulses
- 1.2/50 µs voltage up to 30 kV
- Protection relay 0.5J/500 Ohm impulse network
Documents
Insulation Test SystemYour Benefits
- Stable impulse form at EUT
- Current and voltage integral measurements for breakdown detection
- Upgradeable hardware to enhance test capability
- Designed for long duration production test environments
- Direct interface with DSO for control, data collection and report handling
IEC 60747-17 | Semiconductor insulation |
IEC 60060-1 | High-voltage test techniques - Part 1: General definitions and test requirements |
IEC 60664-1 | Insulation coordination for equipment within low-voltage systems - Part 1: Principles, requirements and tests |
IEC 61439-1 | Low-voltage switchgear and controlgear assemblies - Part 1: General rules |
IEC 61980-1 | Electric vehicle wireless power transfer (WPT) systems - Part 1: General requirements |
IEC 60335 | |
IEC 61180 | High-voltage test techniques for low-voltage equipment - Definitions, test and procedure requirements, test equipment |